发明名称 APPARATUS AND METHOD FOR DETECTING PARTICLES BY USING LIGHT IRRADIATION UNIT
摘要 PURPOSE: An apparatus and a method for detecting particles are provided to detect particles by irradiating light parallel to an upper surface of a processing target. CONSTITUTION: A light irradiation unit(110) irradiates light parallel to an upper surface of a processing target in order to detect particles from the processing target supported by a stage. A driving unit(112) generates the relative motion between the light irradiation unit and the processing target in order to scan the light irradiated from the light irradiation unit. A detection unit(130a) detects the scattered light from the irradiated light of the light irradiation unit or the particles.
申请公布号 KR20040088139(A) 申请公布日期 2004.10.16
申请号 KR20030022225 申请日期 2003.04.09
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, DEOK YONG;YANG, DEOK SEON
分类号 G01N21/94;G01N21/95;(IPC1-7):H01L21/66 主分类号 G01N21/94
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