发明名称 PHOTOSENSITIVE POLYIMIDE PRECURSOR, PHOTOSENSITIVE POLYIMIDE RESIN COMPOSITION AND METHOD FOR MANUFACTURING SEMICONDUCTOR ELEMENT USING THE RESIN COMPOSITION
摘要 <P>PROBLEM TO BE SOLVED: To provide a photosensitive polyimide precursor which can form a polyimide film having reduced thermal expansiveness and residual stress, excellent adhesion to a base, increased breaking strength and elongation at break, furthermore reduces the warpage caused in a silicon wafer when the film is formed on the silicon wafer, and a photosensitive polyimide resin composition. <P>SOLUTION: The photosensitive polyimide precursor has a repeating unit formed of a polycondensation product of a tetracarboxylic acid or its acid anhydride and a diamine in the main chain and actinic radiation sensitive groups at its both terminals. The tetracarboxylic acid or its acid anhydride contains 70-100 mol% aromatic tetracarboxylic acid or its acid anhydride having a rigid structure and the diamine contains 70-100 mol% aromatic diamine having a rigid structure. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004285129(A) 申请公布日期 2004.10.14
申请号 JP20030076645 申请日期 2003.03.19
申请人 NIPPON ZEON CO LTD;FUJITSU LTD 发明人 TANAKA AKIRA;ISHIZUKI YOSHIKATSU
分类号 G03F7/004;C08G73/10;G03F7/027;G03F7/038;G03F7/40;H01L23/29;H01L23/31 主分类号 G03F7/004
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