发明名称 Self-aligned contact for silicon-on-insulator devices
摘要 A method for forming a self-aligned contact to an ultra-thin body transistor first providing an ultra-thin body transistor with source and drain regions operated by a gate stack; forming a contact spacer on the gate stack; forming a passivation layer overlying the transistor; forming a contact hole in the passivation layer exposing the contact spacer and the source/drain regions; filling the contact hole with an electrically conductive material; and establishing electrical communication with the source/drain region.
申请公布号 US2004203211(A1) 申请公布日期 2004.10.14
申请号 US20030409810 申请日期 2003.04.08
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 YANG FU-LIANG;YEO YEE-CHIA;TSENG HORNG-HUEI;HU CHENMING
分类号 H01L21/336;H01L21/60;H01L29/786;(IPC1-7):H01L21/336;H01L21/44;H01L21/320;H01L21/476;H01L29/76 主分类号 H01L21/336
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