发明名称 Leakage current reduction for CMOS memory circuits
摘要 A CMOS integrated circuit (e.g., an SRAM or a DRAM) is partitioned into a core block, a peripheral block, and a retention block. The core block includes circuits (e.g., memory cells) that are powered on at all times and is coupled directly to power supply and circuit ground. The peripheral block includes circuits that may be powered on or off and are coupled to the power supply via a head switch and/or to circuit ground via a foot switch. The switches and the core block may be implemented with high threshold voltage (high-Vt) FET devices to reduce leakage current. The peripheral block may be implemented with low-Vt FET devices for high-speed operation. The retention block includes circuits (e.g., pull-up devices) that maintain signal lines (e.g., word lines) at a predetermined level so that the internal states of the core block are retained when the peripheral block is powered off.
申请公布号 US2004196724(A1) 申请公布日期 2004.10.07
申请号 US20030641883 申请日期 2003.08.14
申请人 CHEN NAN;ZHONG CHENG;SANI MEHDI HAMIDI 发明人 CHEN NAN;ZHONG CHENG;SANI MEHDI HAMIDI
分类号 G11C11/4074;G11C11/413;(IPC1-7):G11C8/00 主分类号 G11C11/4074
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