| 摘要 |
The test probe includes two arms, each having a front portion with a slot therethrough and a downwardly extending tip terminating in a probe end for contacting a test circuit. The first arm's tip is shorter than that of the second arm. A rear portion is affixable to a retaining block. A central portion includes an arm for connection with the circuit. The arms are commonly oriented with the second arm above and generally coplanar with the first arm in a first plane. The probe ends are generally coplanar in a second plane generally perpendicular to the first plane. Typically an assembly includes a first plurality of arms, affixed in stacked relation in a retaining block, and a second plurality of arms, affixed in stacked relation in the retaining block in opposite orientation to the first plurality, with multiple levels of arms extending parallel to the arm plane.
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