发明名称 ELECTRODE FOR P-TYPE GALLIUM NITRIDE-BASED SEMICONDUCTORS
摘要 An improved electrode for a p-type gallium nitride based semiconductor material is disclosed that includes a layer of an oxidized metal and a first and a second layer of a metallic material. The electrode is formed by depositing three or more metallic layers over the p-type semiconductor layer such that at least one metallic layer is in contact with the p-type semiconductor layer. At least two of the metallic layers are then subjected to an annealing treatment in the presence of oxygen to oxidize at least one of the metallic layers to form a metal oxide. The electrodes provide good ohmic contacts to p-type gallium nitride-based semiconductor materials and, thus, lower the operating voltage of gallium nitride-based semiconductor devices.
申请公布号 WO03107442(A3) 申请公布日期 2004.09.02
申请号 WO2003US19034 申请日期 2003.06.17
申请人 KOPIN CORPORATION;OH, TCHANG-HUN;CHOI, HONG, K.;TSAUR, BOR-YEU;FAN, JOHN, C., C.;LIAO, SHIRONG;NARAYAN, JAGDISH 发明人 OH, TCHANG-HUN;CHOI, HONG, K.;TSAUR, BOR-YEU;FAN, JOHN, C., C.;LIAO, SHIRONG;NARAYAN, JAGDISH
分类号 H01L21/285;H01L33/32;H01L33/38;H01L33/40;H01L33/42 主分类号 H01L21/285
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