发明名称 SEMICONDUCTOR APPARATUS AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To prevent the situation in which the film remainder of a conductive film to be a capacitance upper electrode is generated on the sides of a capacitance lower electrode and a wiring. SOLUTION: A semiconductor apparatus has the capacitance lower electrode 111a and the leading-out wiring 111b formed on a first insulating film 110 formed on a semiconductor substrate 100 by the same process, a capacitance insulating film 112a formed on the lower electrode 111a and formed in a region inner than a region in which the lower electrode 111a is formed, and the capacitance upper electrode 113a formed on the insulating film 112a and formed in a region inner than a region in which the insulating film 112a is formed. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004235200(A) 申请公布日期 2004.08.19
申请号 JP20030018563 申请日期 2003.01.28
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 MITSUSHIMA TAKESHI
分类号 H01L27/04;H01L21/822;(IPC1-7):H01L21/822 主分类号 H01L27/04
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