发明名称 Method and system for analyzing test devices
摘要 A method and system for automatically and optically analyzing one or more test devices using a digital scanner coupled to a computer. In one embodiment, the method and system utilizes a template for use in conjunction with the scanner wherein one or more test devices are received and held within respective windows in the template. In this way, the template prevents any significant movement of the test devices in the scanning device during scanning, thereby allowing an accurate scan of the color indicators of each test device. In a further embodiment, the windows of the template define target areas for analysis by imaging software that analyzes the digital images of the test devices.
申请公布号 US2004162690(A1) 申请公布日期 2004.08.19
申请号 US20030701717 申请日期 2003.11.04
申请人 LEE JIN PO 发明人 LEE JIN PO
分类号 G01N;G01N33/48;G01N33/543;G06F19/00;(IPC1-7):G06F19/00 主分类号 G01N
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