| 摘要 |
PROBLEM TO BE SOLVED: To provide a test system of a semiconductor device, which eliminates such a probability that large current flows through a connection section of a connected semiconductor device in the case setting of terminals is changed in accordance with a change in functional tests, thereby avoiding such a state that a measurement is carried out unstably or the test can not be conducted. SOLUTION: In the test system in which the setting of the terminals Q1, Q2 is changed in accordance with test contents in such a state that the first and second terminals Q1, Q2 to which comparators 7, 8 and drivers 9, 10 are connected in parallel are connected to corresponding first and second pins P1, P2 of the semiconductor device 2 to be tested, the first and second terminals Q1, Q2 are connected to current limit means in a first and a second power supply sections 18, 23, which limit the current to a prescribed current value flowing in the semiconductor device 2 through the terminals Q1, Q2 in the case of changing the terminal setting. COPYRIGHT: (C)2004,JPO&NCIPI
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