发明名称 SAMPLE INSPECTION SYSTEM
摘要 PROBLEM TO BE SOLVED: To reliably notify a user of a sample inspection system of the presence of inspection omission and to thereby improve inspection reliability. SOLUTION: The sample inspection system is provided with a first inspection device for inspecting samples, a second inspection device of which the operation is determined by the result of inspection of the first inspection device, a transfer device for transferring the samples to the first and second inspection devices, and a control device for controlling the action of the first and second inspection devices and of the transfer device. The control device evaluates the result of inspection of the first inspection device, determines the operation of the second inspection device on the basis of the result of evaluation, and issues an alarm in the case that the second inspection device is not able to execute the determined action in the sample inspection system. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004226065(A) 申请公布日期 2004.08.12
申请号 JP20030010334 申请日期 2003.01.17
申请人 SYSMEX CORP 发明人 ONISHI YUJI
分类号 G01N35/02;G01N35/04;(IPC1-7):G01N35/02 主分类号 G01N35/02
代理机构 代理人
主权项
地址