发明名称 Method of fabricating shallow trench isolation
摘要 A method of fabricating shallow trench isolation. In the method, a refill step of oxide layer and a step of forming a sacrificial layer on the semiconductor substrate are applied after filling insulating layer into the shallow trenches. The purpose of the steps is to protect the oxide layer on the semiconductor substrate and the corner of the shallow trenches, used to isolate the STI.
申请公布号 US6774007(B2) 申请公布日期 2004.08.10
申请号 US20020244988 申请日期 2002.09.17
申请人 NANYA TECHNOLOGY CORPORATION 发明人 LIU HSIEN-WEN;MAO HUI MIN;CHEN YI-NAN;CHEN YI-CHEN
分类号 H01L21/76;H01L21/762;H01L27/148;(IPC1-7):H01L21/76 主分类号 H01L21/76
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