| 摘要 |
PROBLEM TO BE SOLVED: To provide a system for automatically generating a test program/test pattern of a mixed-signal LSI which reduces man-hours for developing a test program, eliminates human errors, improves test quality, and easily generates a test program. SOLUTION: The system automatically generates a test program and an analogue section test pattern of a mixed-signal LSI to be tested by a digital section test program of the mixed-signal LSI to be tested, and an analogue core test program model file and an analogue core test pattern model file which are retrieved based on an analogue core information file which is retrieved from an analogue core test database. COPYRIGHT: (C)2004,JPO&NCIPI
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