发明名称 Capacitor of semiconductor device and method for manufacturing the same
摘要 Provided is a capacitor of a semiconductor device. The capacitor includes a capacitor lower electrode disposed on a semiconductor substrate. A first dielectric layer comprising aluminum oxide (Al2O3) is disposed on the capacitor lower electrode. A second dielectric layer comprising a material having a higher dielectric constant than that of aluminum oxide is disposed on the first dielectric layer. A third dielectric layer comprising aluminum oxide is disposed on the second dielectric layer. A capacitor upper electrode is disposed on the third dielectric layer. The capacitor of the present invention can improve electrical properties. Thus, power consumption can be reduced and capacitance per unit area is high enough to achieve high integration.
申请公布号 US2004141390(A1) 申请公布日期 2004.07.22
申请号 US20030748308 申请日期 2003.12.29
申请人 WON SEOK-JUN;YOON MYONG-GEUN;JEONG YONG-KUK;KWON DAE-JIN 发明人 WON SEOK-JUN;YOON MYONG-GEUN;JEONG YONG-KUK;KWON DAE-JIN
分类号 H01L21/8242;G11C29/00;H01L21/02;H01L21/314;H01L21/316;(IPC1-7):G11C29/00 主分类号 H01L21/8242
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