发明名称 |
SONOS MEMORY DEVICE WITH SIDE GATE AND FABRICATING METHOD THEREOF |
摘要 |
PURPOSE: A SONOS(substrate-oxide-nitride-oxide-silicon) memory device with a side gate is provided to increase integration 1.5-2 times as much as a conventional technology according to a type that a memory node is formed on the side surface of a channel region by storing at least two informations in each memory device. CONSTITUTION: A semiconductor substrate is prepared. An insulation layer is formed on the semiconductor substrate. A conductive layer that is partitioned into a source region(44), a drain region(46) and a channel region(42) is formed on a predetermined region of the insulation layer. The first and second side gate stacked material is stacked on both side surfaces of the channel region of the conductive layer.
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申请公布号 |
KR20040064053(A) |
申请公布日期 |
2004.07.16 |
申请号 |
KR20030001311 |
申请日期 |
2003.01.09 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, JEONG U;LEE, JO WON;RYU, WON IL;YOON, SE UK |
分类号 |
H01L21/8247;H01L21/28;H01L21/336;H01L27/115;H01L29/423;H01L29/788;H01L29/792;(IPC1-7):H01L27/115 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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