发明名称 SONOS MEMORY DEVICE WITH SIDE GATE AND FABRICATING METHOD THEREOF
摘要 PURPOSE: A SONOS(substrate-oxide-nitride-oxide-silicon) memory device with a side gate is provided to increase integration 1.5-2 times as much as a conventional technology according to a type that a memory node is formed on the side surface of a channel region by storing at least two informations in each memory device. CONSTITUTION: A semiconductor substrate is prepared. An insulation layer is formed on the semiconductor substrate. A conductive layer that is partitioned into a source region(44), a drain region(46) and a channel region(42) is formed on a predetermined region of the insulation layer. The first and second side gate stacked material is stacked on both side surfaces of the channel region of the conductive layer.
申请公布号 KR20040064053(A) 申请公布日期 2004.07.16
申请号 KR20030001311 申请日期 2003.01.09
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, JEONG U;LEE, JO WON;RYU, WON IL;YOON, SE UK
分类号 H01L21/8247;H01L21/28;H01L21/336;H01L27/115;H01L29/423;H01L29/788;H01L29/792;(IPC1-7):H01L27/115 主分类号 H01L21/8247
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