发明名称 Method for fabricating a capacitor
摘要 A method for fabricating capacitor capable of simplifying formation processes of ruthenium (Ru) layer for storage node electrode formation of capacitor comprises the steps of: forming a first insulating layer having a first opening exposing a predetermined region on a substrate; forming a conductive plug filled within the first opening; forming a second insulating layer having a second opening exposing the conductive plug on the first insulating layer; forming a conductive layer covering the second opening by sequentially performing PECVD and LPCVD processes on the second insulating layer; exposing the second insulating layer by performing etch back on the conductive layer; forming a storage node electrode of the capacitor by removing the second insulating layer; and forming a dielectric layer to cover the storage node electrode; and forming a plate electrode. In an alternative embodiment, a thermal treatment under an N2 gas supply is performed after the step of forming the conductive layer.
申请公布号 US6762090(B2) 申请公布日期 2004.07.13
申请号 US20020067951 申请日期 2002.02.05
申请人 HYNIX SEMICONDUCTOR INC. 发明人 AHN BYOUNG KWON;PARK SUNG HOON;KIM JOON HO
分类号 H01L21/8242;H01L21/02;H01L21/336;H01L21/768;H01L27/108;(IPC1-7):H01L21/824 主分类号 H01L21/8242
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