发明名称 FLAW INSPECTION METHOD FOR STRIP-LIKE MATERIAL AND FLAW INSPECTION DEVICE THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a flaw inspection method for a strip-like material which observes the flaw of the strip-like material detected during feed without stopping the feed of the strip-like material, and a flaw inspection device therefor. SOLUTION: The flaw inspection device is equipped with a flaw detecting part 11 for detecting the flaw of a continuously fed strip-like material 15 to acquire the position data of the flaw on the strip-like material 15, a flaw observing part 13 which is arranged on the downstream side of the strip-like material 15 of the flaw detecting part 11 and stops the flow part detected by the flaw detecting part 11 of the strip-like material 15 to observe the same and a transfer speed converting part 12 which is arranged between the flaw detecting part 11 and the flaw observing part 13 with respect to the feed direction of the strip-like material 15 and extends the length of the feed route of the strip-like material 15 fed from the upstream side in a freely extensible and contractable manner to reconcile the detection of the flaw while feeding the strip-like material 15 in the flaw detection part 11 and the observation of the flaw in such a state that the strip-like material 15 in the flaw observing part 13 is stopped. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004184087(A) 申请公布日期 2004.07.02
申请号 JP20020347587 申请日期 2002.11.29
申请人 FUJI PHOTO FILM CO LTD 发明人 WAKITA TAKESHI
分类号 G01N21/892;(IPC1-7):G01N21/892 主分类号 G01N21/892
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