| 摘要 |
<P>PROBLEM TO BE SOLVED: To highly accurately detect color slippage by a simple and inexpensive configuration. <P>SOLUTION: An alignment pattern Pm is constituted by successively forming patches obtained by making the relative positional relationship of the line images of two colors deviate per an arbitrary amount by taking a plurality of lines formed by overlapping the line image Bk of black which is a reference color and the line image C of a color other than the reference color, for instance, cyan as one patch. The line width of the alignment pattern is formed so as to satisfy a relation: (line width)<(photodetective width)×(5.0627×(write-in density (dpi))<SP>-0.5331</SP>) as the relation between the write-in density of an image forming apparatus and the light receiving width of an alignment pattern detecting means, and a factor by the relation between the line width deteriorating the linearity of two straight lines for the arbitrary shift amount of the line image of the color other than the reference color and the light receiving width is reduced. <P>COPYRIGHT: (C)2004,JPO&NCIPI |
