发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device capable of correcting an error which occurs between a replica circuit and a real circuit. SOLUTION: A skew comparator circuit 10A compares a signal that is outputted from an oscillation circuit 15A and passed through an output circuit 06A of the real circuit and an input circuit 04A of the real circuit with a signal that is outputted from the oscillation circuit 15A and passed through a replica circuit 11A of an input circuit and a replica circuit 12A of an output circuit, to detect the delay error between the real circuit and the replica circuit. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004187219(A) 申请公布日期 2004.07.02
申请号 JP20020354993 申请日期 2002.12.06
申请人 ELPIDA MEMORY INC 发明人 ARAI SANENARI
分类号 H03K19/0175;G06F13/00;H01L27/00;H03K5/00;H03K5/12;H03K5/135;H03L7/00;(IPC1-7):H03K19/017 主分类号 H03K19/0175
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