发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a semiconductor device is provided to be capable of preventing encroachment of wet-etchant into a cell region when removing an insulating layer in a peripheral region. CONSTITUTION: A plurality of conductive patterns(G1,G2) are formed on a cell region(X-X') and a peripheral region(Y-Y') of a substrate(40). A BPSG layer(45) and a TEOS or HDP oxide layer are sequentially formed on the resultant structure. Plugs(48) are formed to contact the substrate between the conductive patterns through the oxide layer and the BPSG layer of the cell region. At this time, a dummy pattern(48') is simultaneously formed between the cell and peripheral region. By using a photoresist pattern to open the peripheral region, the oxide layer and the BPSG layer of the peripheral region are removed.
|
申请公布号 |
KR20040057711(A) |
申请公布日期 |
2004.07.02 |
申请号 |
KR20020084502 |
申请日期 |
2002.12.26 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, SANG IK;LEE, MIN SEOK;LEE, SEONG GWON |
分类号 |
H01L21/8239;(IPC1-7):H01L21/823 |
主分类号 |
H01L21/8239 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|