发明名称 |
Image display device and testing method of the same |
摘要 |
It is the primary object of the present invention to provide a simple and accurate testing circuit and a testing method while occupying as small space as possible in an image display device. The testing circuit including a NAND circuit connected in series is mounted on the image display device. A broken wiring on a data signal line and a defect in a data latch circuit can be detected by observing an output waveform from the testing circuit. Accordingly, a broken wiring or the like on the data signal line and a scanning line and a defect in the latch circuit can be tested simply and accurately without an expensive testing apparatus and a great deal of time while occupying as small space as possible.
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申请公布号 |
US2004119824(A1) |
申请公布日期 |
2004.06.24 |
申请号 |
US20030733103 |
申请日期 |
2003.12.11 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
发明人 |
OSADA TAKESHI |
分类号 |
G09G3/00;G09G3/34;(IPC1-7):G09G3/34 |
主分类号 |
G09G3/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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