发明名称 Method of fabricating MOS transistors
摘要 A method of fabricating a MOS transistor is provided. According to the method, a rapid thermal anneal is applied to a semiconductor substrate having active regions doped with well impurity ions and channel impurity ions. Thus, during implantation of the well and the channel impurity ions, crystalline defects resulting from the implantation can be cured by the rapid thermal anneal.
申请公布号 US6753227(B2) 申请公布日期 2004.06.22
申请号 US20030437881 申请日期 2003.05.13
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHO CHANG-HYUN;KOH GWAN-HYEOB;KIM KI-NAM
分类号 H01L21/265;H01L21/28;H01L21/336;H01L21/8238;H01L27/092;H01L29/49;H01L29/78;(IPC1-7):H01L21/336 主分类号 H01L21/265
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