发明名称 |
SEMICONDUCTOR MEMORY DEVICE WITH ISLAND-TYPE SEMICONDUCTOR LAYER AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A semiconductor memory device and a manufacturing method thereof are provided to reduce the influence of back-bias effect on the device and to increase remarkably the capacitance ratio of a floating gate and a control gate by using an island-type semiconductor layer. CONSTITUTION: A semiconductor memory device includes the first conductive type semiconductor substrate(100) and a memory cell. The memory cell is composed of at least one island-type semiconductor layer(110), a charge storage layer formed at both sidewalls of the semiconductor layer, and a control gate(520). The memory cell is arranged in series. The semiconductor layer has different cross-sectional areas from bottom to top. The semiconductor layer has an insulating layer for passing electric charges.
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申请公布号 |
KR20040049281(A) |
申请公布日期 |
2004.06.11 |
申请号 |
KR20030087743 |
申请日期 |
2003.12.04 |
申请人 |
FUJIO MASUOKA;SHARP CORPORATION |
发明人 |
ENDOH TETSUO;FUJIO MASUOKA;TANIGAMI TAKUJI;YOKOYAMA TAKASHI;HORII SHINJI |
分类号 |
H01L21/8247;G11C16/04;H01L21/28;H01L21/336;H01L21/8246;H01L21/84;H01L27/02;H01L27/115;H01L27/12;H01L29/06;H01L29/788;H01L29/792;(IPC1-7):H01L27/115 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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