发明名称 Guard ring structure for reducing crosstalk and latch-up in integrated circuits
摘要 An integrated circuit having very low parasitic current gain includes a guard ring that is used to completely surround a device, such as a power device, that induces parasitic current. The guard ring is formed in a semiconductor body layer such as an epitaxial layer and has a central guard ring of the same type conductivity as that of the body layer and additional flanking rings of the opposite type conductivity. An unbiased configuration of the guard ring based on the above structure is particularly effective in reducing the parasitic gain. The effectiveness of the guard ring, such as the high current performance, is further improved by reducing the resistance between neighboring rings using various methods.
申请公布号 US6747294(B1) 申请公布日期 2004.06.08
申请号 US20020255561 申请日期 2002.09.25
申请人 POLARFAB LLC 发明人 GUPTA SANDHYA;KOSIER STEVE L.;BECKMAN JOHN C.
分类号 H01L21/761;H01L21/765;H01L29/06;(IPC1-7):H01L29/423 主分类号 H01L21/761
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