发明名称 Device under test interface card with on-board testing
摘要 The present invention concerns an apparatus comprising a first plurality of contacts, a second plurality of contacts, one or more sockets, and a programmable processor. The first plurality of contacts may be configured to receive one or more first signals. The second plurality of contacts may be configured to present one or more second signals in response to the one or more first signals. The one or more sockets may be configured to receive one or more third signals from one or more programmable devices. The programmable processor may be configured to generate a test signal in response to (i) the one or more first signals and (ii) the one or more third signals.
申请公布号 US6747473(B2) 申请公布日期 2004.06.08
申请号 US20020252488 申请日期 2002.09.23
申请人 LSI LOGIC CORPORATION 发明人 COWAN JOSEPH W.
分类号 G01R31/28;(IPC1-7):G01R31/26 主分类号 G01R31/28
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