发明名称 ATOMIC LAYER DEPOSITION OF HIGH K DIELECTRIC FILMS
摘要 A method of processing a semiconductor substrate includes reacting in a reactor a first reactant gas, evacuating the first reactant gas from the reactor, reacting a second reactant gas, and evacuating the second reactant gas. The reacting of the first reactant gas reacts the first reactant gas with an exposed surface of the semiconductor substrate in a reactor to convert the exposed surface into a solid mono-layer. The reacting of the second reactant gas reacts the second reactant gas with the solid mono-layer in the reactor to convert the solid mono-layer into a gaseous compound. The evacuating of the second reactant gas also evacuates the gaseous compound from the reactor.
申请公布号 WO2004008827(A3) 申请公布日期 2004.06.03
申请号 WO2003US22712 申请日期 2003.07.21
申请人 AVIZA TECHNOLOGY, INC.;LEE, SANG-IN;SENZAKI, YOSHIHIDE 发明人 LEE, SANG-IN;SENZAKI, YOSHIHIDE
分类号 C23C16/02;C23C16/40;C23C16/44;C23C16/455;H01L21/314;H01L21/316 主分类号 C23C16/02
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