| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor memory permitting to perform an efficient burn-in test in a logic-consolidated device or the like. SOLUTION: The semiconductor memory is provided with an isolation part for isolating a bit line BL in a 1st area including a memory cell formed of a thick film transistor and a 2nd area including a sense amplifier formed of a thin film transistor. Moreover, voltage supply lines are provided corresponding to the respective areas. In a test mode, the isolation unit isolates the two areas, and a test voltage is supplied from the voltage supply line. Thus, a test voltage corresponding to a thick film transistor and a thin film transistor can be supplied to allow an efficient burn-in test to be performed. COPYRIGHT: (C)2004,JPO
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