发明名称 Method of manufacturing integrated circuit resistors in a CMOS process
摘要 An integrated circuit resistor (150) is formed on an isolation dielectric structure (20) formed in a semiconductor (10). A patterned silicon nitride layer (74) is formed on the surface of the resistor polysilicon layer (40) that functions to mask the surface of the integrated circuit resistor (150) during the formation of metal silicide regions (140) on the integrated circuit resistor (150).
申请公布号 EP1422744(A2) 申请公布日期 2004.05.26
申请号 EP20030104321 申请日期 2003.11.21
申请人 TEXAS INSTRUMENTS INC. 发明人 BALDWIN, GREG C.
分类号 H01L21/02;H01L21/8238;H01L27/06;(IPC1-7):H01L21/02 主分类号 H01L21/02
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