发明名称 Apparatus for detecting defects
摘要 An electric parts drive circuit has : a first field-effect transistor including in parallel a first parasitic diode and provided between the plus line and an electric part; a second field-effect transistor including in parallel a second parasitic diode, the first and second field-effect transistors being connected in series in order from the plus line to the electric part; a third field-effect transistor including in parallel a third parasitic diode and provided between a minus line and the electric part; a failure diagnosis switch unit; and a switch control unit, wherein the switch control unit diagnoses a failure of the second field-effect transistor based on the voltage between the first and second field-effect transistors responsive to switching between conduction and shutoff of the second field-effect transistor in a state that the first and third field-effect transistors are shut off and the failure diagnosis switch unit is brought into conduction. <IMAGE>
申请公布号 EP1420257(A2) 申请公布日期 2004.05.19
申请号 EP20030026032 申请日期 2003.11.12
申请人 NISSIN KOGYO CO., LTD. 发明人 AMADA, JUNICHI;TUCHIYA, TOMOHARU
分类号 H01F7/18;G01R31/28;(IPC1-7):G01R31/00 主分类号 H01F7/18
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