发明名称 Semiconductor device and method and system for fabricating the same
摘要 A capacitor including a capacitor lower electrode, a capacitor dielectric film of a highly dielectric film or a ferroelectric film and a capacitor upper electrode is formed on a semiconductor substrate. A protection film is formed on the semiconductor substrate so as to cover the capacitor. A first TEOS film having a relatively large water content is formed on the protection film through first TEOS-O3 CVD where an ozone concentration is relatively low. A second TEOS-O3 film having a relatively small water content is formed on the first TEOS-O3 film through second TEOS-O3 CVD where the ozone concentration is relatively high.
申请公布号 US6737697(B2) 申请公布日期 2004.05.18
申请号 US20010779662 申请日期 2001.02.09
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 KUTSUNAI TOSHIE;HAYASHI SHINICHIRO;JUDAI YUJI;NAGANO YOSHIHISA
分类号 H01L23/522;C23C16/40;H01L21/02;H01L21/316;H01L21/318;H01L21/768;H01L21/822;H01L21/8234;H01L21/8242;H01L21/8246;H01L27/04;H01L27/06;H01L27/105;H01L27/108;(IPC1-7):H01L29/76;H01L29/94;H01L31/062 主分类号 H01L23/522
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