发明名称 Attenuated embedded phase shift photomask blanks
摘要 An attenuating embedded phase shift photomask blank that produces a phase shift of the transmitted light is formed with an optically translucent film made of metal, silicon, nitrogen and oxygen. An etch stop layer is added to improve the etch selectivity of the phase shifting layer. A wide range of optical transmission (0.001% up to 15% at 157 nm) is obtained by this process.
申请公布号 US6730445(B2) 申请公布日期 2004.05.04
申请号 US20020303341 申请日期 2002.11.22
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 ANGELOPOULOS MARIE;BABICH KATHERINA;CHEY S. JAY;HIBBS MICHAEL STRAIGHT;LANG ROBERT N.;MAHOROWALA ARPAN PRAVIN;RACETTE KENNETH CHRISTOPHER
分类号 G03F1/08;C23C14/06;C23C14/08;G03F1/00;H01L21/027;(IPC1-7):G03F9/00 主分类号 G03F1/08
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