发明名称 Semiconductor device having an overhanging structure and method for fabricating the same
摘要 An edge of a passivation film is positioned inside an edge of an overhanging emitter structure by a distance L so that a base electrode layer is formed at an interval not to overlap the edge of the passivation film even when the base electrode layer is formed by etching with the emitter structure as a mask.
申请公布号 US6730586(B2) 申请公布日期 2004.05.04
申请号 US20020092308 申请日期 2002.03.07
申请人 FUJITSU QUANTUM DEVICES LIMITED 发明人 ENDOH HIROSHI
分类号 H01L29/41;H01L21/331;H01L21/338;H01L29/737;H01L29/812;(IPC1-7):H01L21/28 主分类号 H01L29/41
代理机构 代理人
主权项
地址