发明名称 Integration of annealing capability into metal deposition or CMP tool
摘要 Integration of annealing capability into a metal deposition tool or a chemical mechanical polishing (CMP) tool. A wafer processing apparatus includes a metal deposition tool having annealing capability. The metal deposition tool can be an electroplating tool or a chemical vapor deposition tool or other metal deposition tool that deposits metal films, such as copper, onto silicon substrates for integrated circuit manufacturing. An annealing chamber is integrated into the metal deposition tool so that annealing of the metal film can be controlled such that the copper is consistently stabilized in preparation for a chemical mechanical polishing process. Alternatively, an annealing chamber can be integrated into a CMP tool.
申请公布号 US6730598(B1) 申请公布日期 2004.05.04
申请号 US19990475729 申请日期 1999.12.30
申请人 INTEL CORPORATION 发明人 YU JICK M.
分类号 C23C16/56;H01L21/00;(IPC1-7):H01L21/44;B05D5/12;C23C16/00 主分类号 C23C16/56
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