发明名称 Structure and method for forming a faceted opening and a layer filling therein
摘要 Structure and method for filling an opening in a semiconductor structure that is less susceptible to the formation of voids. A first layer of a first material is formed over the layer in which the opening is to be formed, and a faceted opening is formed in the first layer. The opening in the underlying layer is subsequently formed, and the material that is to fill the opening is deposited over the faceted opening and into the opening of the underlying layer.
申请公布号 US6727158(B2) 申请公布日期 2004.04.27
申请号 US20010007295 申请日期 2001.11.08
申请人 MICRON TECHNOLOGY, INC. 发明人 SUNDT DIRK J.;POLINSKY WILLIAM A.;BOSSLER MARK A.;VIDELA GABRIEL G.;INMAN CHRIS L.
分类号 H01L21/308;H01L21/762;(IPC1-7):H01L21/76 主分类号 H01L21/308
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