发明名称 THERMAL LENS ANALYTICAL EQUIPMENT
摘要 PROBLEM TO BE SOLVED: To provide thermal lens analytical equipment capable of stably analyzing a thermal lens. SOLUTION: The thermal lens analytical equipment 1 is provided with a rod lens 10, which irradiates a sample solution with an exciting light and a detection light; a PD 11 which detects the signal intensities of detected light, before and after forming the thermal lens 12 in the sample solution; and a computer which computes TLM outputs from the signal intensities detected by the PD 11. In the analysis, the thermal lens 12, having a distribution for the refraction index according to a propagation intensity I(r, z) of an exciting beam is approximated by an SNS laminated optical system 3 having a difference of refraction index dn as a variable, and the detection light having a chromatic aberration df as a variable is irradiated to the thermal lens 12, and then the light is received by the PD 11 with a normalized PD distance Lo as a variable, in order to obtain the TLM outputs. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004125478(A) 申请公布日期 2004.04.22
申请号 JP20020286929 申请日期 2002.09.30
申请人 NIPPON SHEET GLASS CO LTD 发明人 TOYAMA MINORU;YAMAGUCHI ATSUSHI;HATTORI AKIHIKO
分类号 G01N25/16;G01N21/41;(IPC1-7):G01N25/16 主分类号 G01N25/16
代理机构 代理人
主权项
地址