发明名称 OPERATIONAL SPEED MEASURING CIRCUIT AND SEMICONDUCTOR DEVICE INCORPORATING THE SAME
摘要 PROBLEM TO BE SOLVED: To easily estimate the operational speed of the whole of a semiconductor device. SOLUTION: A semiconductor integrated circuit 1 is composed of blocks 10, 20, 30, 40, 50, 60. Blocks 10, 20, 30, 40, 60 out of these incorporate ring oscillator portions (a ring oscillator portion 11 in the case of the block 10) for measuring the operational speeds of circuits in the blocks. These ring oscillator portions can also be connected to the ring oscillator portions of other blocks via selecting portions (a selecting portion 12 in the case of the block 10). When a ring oscillator is formed in a block by setting for a selecting portion, the operational speed of the block can be measured from the output signal of this ring oscillator. When a selection for causing the whole of the integrated circuit 1 to form a ring oscillator by the selecting portions is made, the operational speed of the whole of the integrated circuit 1 can be estimated. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004117050(A) 申请公布日期 2004.04.15
申请号 JP20020277755 申请日期 2002.09.24
申请人 SONY CORP 发明人 TANAKA SHUJI
分类号 G01R31/28;H01L21/66;H01L21/822;H01L27/04;(IPC1-7):G01R31/28 主分类号 G01R31/28
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