发明名称 SCATTERED LIGHT MEASURING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a scattered light measuring device, assuring the largest possible scattering angle by reducing a space between a projection axis and a light receiving axis without increasing the diameter of a scattered beam and lowering the quantity of a scattered light. SOLUTION: Optical axis control plates T, J, each with both parallel and planar faces are arranged at an angle to portions of parallel light fluxes between a projection lens 4 and a condenser lens 5 or between a light receiving lens 6 and the condenser lens 5. Both parallel light fluxes can approach each other as they remain in a parallel relationship. Thus, the scattering angle can be made to approach 180°without reducing the quantity of the light. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004109011(A) 申请公布日期 2004.04.08
申请号 JP20020273845 申请日期 2002.09.19
申请人 OTSUKA DENSHI CO LTD 发明人 SEKIWA MITSUNAO;TSUTSUI KAZUNORI;MORISAWA KATSUHIRO;FUJIMOTO SHOJI;TOYOSHIMA ATSUSHI
分类号 G01N15/00;G01N21/49;(IPC1-7):G01N21/49 主分类号 G01N15/00
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