Component testing apparatus e.g. for circuit board inspection, detects fault in component based on diffuse field measured by elements comprising pairs of electrodes

摘要

The apparatus includes a diffuse-field element (51,71) for generating and/or measuring a diffuse field on or in the component. A fault in the electrical component is detected based on the measured diffuse-field. An alternating field may be generated at a potential-carrying part of the component. The diffuse-field element comprises a pair of electrodes (51,71). A number of elements are provide to allow spatially-resolved measurement. An Independent claim is included for a method of testing a component.