发明名称 FLASH MEMORY CELL AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A flash memory cell and a method for manufacturing the same are provided to reduce surface resistance by forming a silicide layer on a buried impurity diffusion layer. CONSTITUTION: Isolation layers are formed on a semiconductor substrate(100). A floating gate of a flash memory is formed on the substrate to cross the isolation layer. By patterning the isolation layers, the substrate between the floating gates is exposed. A buried impurity diffusion layer(112) is formed on the exposed substrate. A silicide layer(114) is then formed on the surface of the buried impurity diffusion layer. An insulating layer(118) is formed on the floating gate. A control gate(120) is formed on the resultant structure to cross the floating gate.
申请公布号 KR20040025243(A) 申请公布日期 2004.03.24
申请号 KR20020057112 申请日期 2002.09.19
申请人 ANAM SEMICONDUCTOR., LTD. 发明人 CHOI, TAE HO;KIM, JAE YEONG
分类号 H01L21/8247;(IPC1-7):H01L21/824 主分类号 H01L21/8247
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