发明名称 |
FLASH MEMORY CELL AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A flash memory cell and a method for manufacturing the same are provided to reduce surface resistance by forming a silicide layer on a buried impurity diffusion layer. CONSTITUTION: Isolation layers are formed on a semiconductor substrate(100). A floating gate of a flash memory is formed on the substrate to cross the isolation layer. By patterning the isolation layers, the substrate between the floating gates is exposed. A buried impurity diffusion layer(112) is formed on the exposed substrate. A silicide layer(114) is then formed on the surface of the buried impurity diffusion layer. An insulating layer(118) is formed on the floating gate. A control gate(120) is formed on the resultant structure to cross the floating gate.
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申请公布号 |
KR20040025243(A) |
申请公布日期 |
2004.03.24 |
申请号 |
KR20020057112 |
申请日期 |
2002.09.19 |
申请人 |
ANAM SEMICONDUCTOR., LTD. |
发明人 |
CHOI, TAE HO;KIM, JAE YEONG |
分类号 |
H01L21/8247;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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