发明名称 Interferometric apparatus for ultra-high precision displacement measurement
摘要 A high-precision heterodyne interferometer measures relative displacement by creating a thermally-insensitive system generally not subject to polarization leakage. By using first and second light beams separated by a small frequency difference (Deltaf), beams of light at the first frequency (f0) are reflected by co-axial mirrors, the first mirror of which has a central aperture through which the light is transmitted to and reflected by the second mirror. Prior to detection, the light beams from the two mirrors are combined with light of the second and slightly different frequency. The combined light beams are separated according to the light from the mirrors. The change in phase (Deltaphi) with respect to the two signals is proportional to the change in distance of Fiducial B by a factor of wavelength (lambda) divided by 4pi (DeltaL=lambdaDeltaphi1/(4pi)). In a second embodiment, a polarizing beam splitting system can be used.
申请公布号 US6710880(B1) 申请公布日期 2004.03.23
申请号 US20010950237 申请日期 2001.09.06
申请人 THE UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF THE NATIONAL AERONAUTICS AND SPACE ADMINISTRATION 发明人 ZHAO FENG
分类号 G01B9/02;(IPC1-7):G01B9/02 主分类号 G01B9/02
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