COLUMN REDUNDANT SYSTEM AND METHOD FOR MICROCELL IMBEDDED DRAM (eDRAM) ARCHITECTURE

摘要

PROBLEM TO BE SOLVED: To provide an effective column restoration system which replaces a defective column element with a redundant element. SOLUTION: A column redundant device 10 includes a fuse information storage device for every individual microcell to store fuse information indicating the location of any one of defective elements. A first bank address decoding mechanism decodes a reading bank address corresponding to a first microcell and a second bank address decoding mechanism decodes a writing bank address corresponding to a second microcell. When at least one defective column element is included in the first microcell, the device 10 generates an internal column address corresponding to at least one defective column element in the first microcell. Similarly, the device 10 generates an internal column address corresponding to at least one defective column element in the second microcell when at least one defective column element is included in the second microcell. COPYRIGHT: (C)2004,JPO