发明名称 Chemical mechanical polishing pad with micro-holes
摘要 Disclosed is a chemical mechanical polishing pad formed at a polishing surface thereof with micro-holes each having a desired cross-sectional area while having a desired depth. The shape, size, and density of the micro-holes can be optionally adjusted. The chemical mechanical polishing pad provides an effect of maintaining a desired polishing rate during a polishing process. In accordance with the present invention, the micro-holes can have diverse arrangements depending on given process conditions.
申请公布号 US2004048559(A1) 申请公布日期 2004.03.11
申请号 US20030110801 申请日期 2003.06.12
申请人 PARK INHA;KWON TAE-KYOUNG;KIM JAESOK 发明人 PARK INHA;KWON TAE-KYOUNG;KIM JAESOK
分类号 B24B37/00;B24B37/04;B24D13/14;H01L21/302;H01L21/304;(IPC1-7):B24B7/22 主分类号 B24B37/00
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