发明名称 METHOD OF MICROPATTERN FORMATION USING SILICON OXIDE FILM
摘要 PROBLEM TO BE SOLVED: To provide a method of micropattern formation using a silicon oxide film. SOLUTION: A photoresist pattern is formed on a material film on which a micropattern is formed. A silicon oxide film, which must be thin and conformal, is deposited on the photoresist pattern without damaging the underlying photoresist pattern. Next, dry etching is performed on a bottom film. At a first stage of dry etching, a spacer is formed on the side wall of the photoresist pattern, then a polymer film is formed on the photoresist pattern. This method avoids the thinning phenomenon of the photoresist pattern to maintain an etching profile and to prevent phenomena such as striation and wiggling from occurring in the patterned film. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004080033(A) 申请公布日期 2004.03.11
申请号 JP20030290758 申请日期 2003.08.08
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 PARK JAE-EUN;SHU KOSHU;LEE JOO-WON;YANG JONG-HO
分类号 G03F7/40;H01L21/027;H01L21/3065;H01L21/3213;(IPC1-7):H01L21/306;H01L21/321 主分类号 G03F7/40
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