发明名称 STRAINED FIN FETS STRUCTURE AND METHOD
摘要 A structure for a transistor that includes an insulator (10) and a silicon structure on the insulator. The silicon structure includes a central portion (155) and Fins (250) extending from ends of the central portion. A first gate (50) is positioned on a first side of the central portion of the silicon structure. A strain-producing layer (11) could be between the first gate (50) and the first side of the central portion (155) of the silicon structure and a second gate (160) is on a second side of the central portion (155) of the silicon structure.
申请公布号 WO03081640(A3) 申请公布日期 2004.03.11
申请号 WO2003US08480 申请日期 2003.03.19
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CLARK, WILLIAM, F.;FRIED, DAVID, M.;LANZEROTTI, LOUIS, D.;NOWAK, EDWARD, J.
分类号 H01L21/336;H01L29/10;H01L29/786 主分类号 H01L21/336
代理机构 代理人
主权项
地址