发明名称 Semiconductor wafer
摘要 A plurality of IC chips each having an internal circuit are mounted on a wafer substrate. A plurality of scribe lines are formed on the wafer substrate for separating the IC chips from one another. A plurality of inspection pads are formed on the scribe lines. Each of the inspection pads is connected to the associated internal circuit via a conduction path for inspecting an operation of the associated IC chip.
申请公布号 US6703251(B2) 申请公布日期 2004.03.09
申请号 US20020267783 申请日期 2002.10.10
申请人 MITSUMI ELECTRIC CO., LTD. 发明人 TERADA YUKIHIRO;MIKI KENICHI
分类号 G01R31/28;H01L21/66;H01L21/822;H01L23/485;H01L23/58;H01L27/04;(IPC1-7):H01L27/10 主分类号 G01R31/28
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