发明名称 MEMORY CARD AND MEMORY CARD TEST METHOD, CAPABLE OF SIMPLIFYING TEST PROCESS
摘要 <P>PROBLEM TO BE SOLVED: To reduce man hour for writing in a memory card test process and reduce testing cost. <P>SOLUTION: A memory card (101) has a memory chip (103) and a controller (102) connected to the memory chip (103) and performing data transfer from the outside. The controller having a buffer (105) for temporarily storing data transfers the data in the buffer to the memory chip and then clears the data in the buffer when in a first mode of operation, while in a second mode of operation transfers the data in the buffer to the memory chip but does not clear the data in the buffer. The controller also having a transfer circuit for transferring the data in the buffer to the memory chip inverts the data in the buffer and transfers the inverted data to the memory chip when in an inverting mode, while in a noninverting mode leaves the data in the buffer noninverted and transfers the noninverted data to the memory chip. Once the data from the outside is transferred into the buffer, external transfer does not need to be further repeated in subsequent internal transfer to the memory chip. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2004070806(A) 申请公布日期 2004.03.04
申请号 JP20020231453 申请日期 2002.08.08
申请人 FUJITSU LTD 发明人 FURUKAWA HIDEYUKI
分类号 G06F12/16;G06F3/06;G06F3/08;G06K17/00;G06K19/07;G11C29/48 主分类号 G06F12/16
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