Extracting wiring parasitics for filtered interconnections in an integrated circuit

摘要

A method, system and computer program product for extracting parasitic resistance and capacitance values to simulate performance of an integrated circuit. A selected number of interconnections in an integrated circuit may be identified ("interconnections of interest"). A netlist containing a list of the transistors in the integrated circuit may be pruned by selecting those transistors in the netlist that are in the channel connected regions on the driving side of the interconnections of interest and those on the receiving side of the interconnections of interest. Parasitic resistance and capacitance values for layout layers connected to the interconnections of interest may be extracted. These extracted parasitic resistance and capacitance values may be associated with the transistors connected to those layout layers in the pruned netlist. By extracting parasitic resistance and capacitance values as describe above, less compute-intensive RC extractions may be made thereby using less memory and processing power.