发明名称 |
Infrared sensor device and manufacturing method thereof |
摘要 |
A supporting beam line (80) for supporting, afloat in a cavity on a semiconductor substrate, an infrared detection pixel (20) comprising an infrared absorption portion (23) for absorbing an incident infrared ray and converting it into heat and a thermoelectric conversion portion (21) for converting a temperature change caused by the heat generated in the infrared absorption portion (23) into an electric signal is formed by a damascene metal (70) on the same layer as the gate (66) of a damascene metal gate MOS transistor (61) to be used in a peripheral circuit. The supporting beam line (80) comprises a conductor line with U-shaped cross section (81) inside which a metal is filled. <IMAGE> <IMAGE> |
申请公布号 |
EP1246251(A3) |
申请公布日期 |
2004.03.03 |
申请号 |
EP20020252282 |
申请日期 |
2002.03.28 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
IIDA, YOSHINORI;SHIGENAKA, KEITARO;MASHIO, NOYA |
分类号 |
G01J1/02;G01J5/20;G01J5/24;H01L21/28;H01L27/14;H01L27/146;H01L27/16;H01L29/423;H01L29/43;H01L29/49;H01L29/786;H01L31/09;H01L37/02 |
主分类号 |
G01J1/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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