发明名称 Infrared sensor device and manufacturing method thereof
摘要 A supporting beam line (80) for supporting, afloat in a cavity on a semiconductor substrate, an infrared detection pixel (20) comprising an infrared absorption portion (23) for absorbing an incident infrared ray and converting it into heat and a thermoelectric conversion portion (21) for converting a temperature change caused by the heat generated in the infrared absorption portion (23) into an electric signal is formed by a damascene metal (70) on the same layer as the gate (66) of a damascene metal gate MOS transistor (61) to be used in a peripheral circuit. The supporting beam line (80) comprises a conductor line with U-shaped cross section (81) inside which a metal is filled. <IMAGE> <IMAGE>
申请公布号 EP1246251(A3) 申请公布日期 2004.03.03
申请号 EP20020252282 申请日期 2002.03.28
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 IIDA, YOSHINORI;SHIGENAKA, KEITARO;MASHIO, NOYA
分类号 G01J1/02;G01J5/20;G01J5/24;H01L21/28;H01L27/14;H01L27/146;H01L27/16;H01L29/423;H01L29/43;H01L29/49;H01L29/786;H01L31/09;H01L37/02 主分类号 G01J1/02
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