发明名称 WET CLEANING EQUIPMENT LOADED WITH BUBBLE DETECTING APPARATUS
摘要 PURPOSE: Wet cleaning equipment loaded with a bubble detecting apparatus is provided to be capable of minimizing the generation of defects caused by bubbles. CONSTITUTION: A wet cleaning equipment(100) is provided with a plurality of chemical baths(110,120,130) for storing various chemicals in order to remove contaminants of a wafer when the wafer and a dry unit(190) are dipped for drying the wafer. The wet cleaning equipment further includes a robot arm(150) for sequentially transferring the wafer from the chemical baths to the dry unit and a plurality of bubble detecting sensors loaded at each chemical bath for transitorily stopping the wet cleaning process when excessive bubbles generats at the chemical bath. Preferably, a vibration detecting sensor is used as the bubble detecting sensor.
申请公布号 KR20040017179(A) 申请公布日期 2004.02.26
申请号 KR20020049320 申请日期 2002.08.20
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 NAM, JU HYEON
分类号 H01L21/304;B08B3/04;H01L21/00;(IPC1-7):H01L21/304 主分类号 H01L21/304
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