发明名称 |
WET CLEANING EQUIPMENT LOADED WITH BUBBLE DETECTING APPARATUS |
摘要 |
PURPOSE: Wet cleaning equipment loaded with a bubble detecting apparatus is provided to be capable of minimizing the generation of defects caused by bubbles. CONSTITUTION: A wet cleaning equipment(100) is provided with a plurality of chemical baths(110,120,130) for storing various chemicals in order to remove contaminants of a wafer when the wafer and a dry unit(190) are dipped for drying the wafer. The wet cleaning equipment further includes a robot arm(150) for sequentially transferring the wafer from the chemical baths to the dry unit and a plurality of bubble detecting sensors loaded at each chemical bath for transitorily stopping the wet cleaning process when excessive bubbles generats at the chemical bath. Preferably, a vibration detecting sensor is used as the bubble detecting sensor.
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申请公布号 |
KR20040017179(A) |
申请公布日期 |
2004.02.26 |
申请号 |
KR20020049320 |
申请日期 |
2002.08.20 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
NAM, JU HYEON |
分类号 |
H01L21/304;B08B3/04;H01L21/00;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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