发明名称 METHOD FOR FORMING FINE PATTERN BY USING SILICON OXIDE LAYER
摘要 PURPOSE: A method for forming a fine pattern by using a silicon oxide layer is provided to prevent the damage of a photoresist pattern by forming a silicon oxide layer on the photoresist pattern. CONSTITUTION: A photoresist layer is formed on an upper surface of a material layer(110). A photoresist pattern(120) is formed by exposing and developing the photoresist layer. The first silicon oxide layer(130) is formed on each upper surface of the material layer(110) and the photoresist pattern in order to prevent the damage of the photoresist pattern(120). A material layer pattern is formed by dry-etching the material layer(110). The first silicon oxide layer(130) is formed under the temperature of 400 degrees centigrade.
申请公布号 KR20040014064(A) 申请公布日期 2004.02.14
申请号 KR20020047233 申请日期 2002.08.09
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOO, GANG SU;LEE, JU WON;PARK, JAE EON;YANG, JONG HO
分类号 G03F7/40;H01L21/027;H01L21/3065;H01L21/3213;(IPC1-7):H01L21/027 主分类号 G03F7/40
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