发明名称 PICK AND PLACE MACHINE WITH COMPONENT PLACEMENT INSPECTION
摘要 <p>Improved component placement inspection and verification is performed by a pick and place machine (301). Improvements include stereovision imaging of the intended placement location; enhanced illumination to facilitate the provision of relatively high-power illumination in the restricted space near the placement nozzle(s) (208, 210, 212); optics (380) to allow image acquisition device (300, 302) to view the placement location (360) from an angle relative to a plane of the placement location, thereby reducing the possibility of such images being obstructed by the component (304); techniques for rapidly acquiring images with commercially available CCD arrays such that acquisition of before and after images does not substantially impact system throughput; and image processing techniques to provide component inspection and verification information.</p>
申请公布号 WO03043400(A9) 申请公布日期 2004.02.12
申请号 WO2002US36154 申请日期 2002.11.12
申请人 CYBEROPTICS CORPORATION 发明人 DUQUETTE, DAVID, W.;HAUGEN, PAUL, R.;FISHBAINE, DAVID;ROTH, SCOTT, D.;BUSHMAN, THOMAS, W.;GAIDA, JOHN, D.;MADSEN, DAVID, D.;DALE, THEODORE, PAUL;LIBERTY, TODD, D.;BUCHIKA, BRANT, O.
分类号 H04N13/00;H05K13/04;H05K13/08;(IPC1-7):H05K13/08 主分类号 H04N13/00
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